Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

• Main Authors: Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Electrical defect; Electron Beam Induced Current; Morphological defect; Scanning Electron Acoustic Microscopy; Solar cell
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/55673
• Institution: National University of Singapore

10.1016/j.solmat.2011.05.022