Dedicated near-field microscopies for electronic materials and devices

Dedicated near-field microscopies for electronic materials and devices

10.1117/12.621577

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Bibliographic Details
Main Authors: Balk, L.J., Cramer, R.M., Heiderhoff, R., Phang, J.Ch., Sergeev, O., Tiedemann, A.-K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Atomic force microscopy
Electronic devices
Functional materials
Near-field scanning microscopy
Scanning photon emission microscopy
Thermo-mechanical properties
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69799
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/69799

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