Dedicated near-field microscopies for electronic materials and devices

10.1117/12.621577

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Bibliographic Details
Main Authors:	Balk, L.J., Cramer, R.M., Heiderhoff, R., Phang, J.Ch., Sergeev, O., Tiedemann, A.-K.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Atomic force microscopy Electronic devices Functional materials Near-field scanning microscopy Scanning photon emission microscopy Thermo-mechanical properties
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69799
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Institution:	National University of Singapore

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