Determination of the local electric field strength near electric breakdown

by Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Determination of the local electric field strength by energy dispersive Photon Emission Microscopy

by Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device

by Heiderhoff, R., Palaniappan, M., Phang, J.C.H., Balk, L.J.
Published 2014

Characterization of electronic materials and devices by scanning near-field microscopy

by Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch.
Published 2014

Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM / ESEM-hybrid-system

by Tiedemann, A.-K., Heiderhoff, R., Balk, L.J., Phang, J.C.H.
Published 2014

Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy

by Hendarto, E., Altes, A., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy

by Tiedemann, A.-K., Fakhri, M., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Dedicated near-field microscopies for electronic materials and devices

by Balk, L.J., Cramer, R.M., Heiderhoff, R., Phang, J.Ch., Sergeev, O., Tiedemann, A.-K.
Published 2014

Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations

by Tiedemann, A.-K., Kurz, K., Fakhri, M., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Correlation of Electronic and Thermal Properties of Short Channel nMOSFETS

by Palaniappan, M., Ng, V., Heiderhoff, R., Phang, J.C.H., Fiege, G.B.M., Balk, L.J.
Published 2014

Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)

by Lee, T.H., Fiege, G.B.M., Altes, A., Zimmermann, G., Ng, V., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Analysis of E-field distributions within high-power devices using IBIC microscopy

by Zmeck, M., Balk, L.J., Heiderhoff, R., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J.
Published 2014