Characterization of electronic materials and devices by scanning near-field microscopy

10.1007/s00339-007-3910-3

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Bibliographic Details
Main Authors: Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55273
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Institution: National University of Singapore