Characterization of electronic materials and devices by scanning near-field microscopy

10.1007/s00339-007-3910-3

Saved in:
Bibliographic Details
Main Authors: Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55273
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items