Characterization of electronic materials and devices by scanning near-field microscopy
10.1007/s00339-007-3910-3
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Main Authors: | Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55273 |
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Institution: | National University of Singapore |
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