Characterization of electronic materials and devices by scanning near-field microscopy

10.1007/s00339-007-3910-3

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Main Authors:	Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55273
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-552732023-10-26T08:36:36Z Characterization of electronic materials and devices by scanning near-field microscopy Balk, L.J. Heiderhoff, R. Phang, J.C.H. Thomas, Ch. ELECTRICAL & COMPUTER ENGINEERING 10.1007/s00339-007-3910-3 Applied Physics A: Materials Science and Processing 87 3 443-449 APAMF 2014-06-17T02:41:11Z 2014-06-17T02:41:11Z 2007-06 Article Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch. (2007-06). Characterization of electronic materials and devices by scanning near-field microscopy. Applied Physics A: Materials Science and Processing 87 (3) : 443-449. ScholarBank@NUS Repository. https://doi.org/10.1007/s00339-007-3910-3 09478396 http://scholarbank.nus.edu.sg/handle/10635/55273 000244950900016 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1007/s00339-007-3910-3
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Balk, L.J. Heiderhoff, R. Phang, J.C.H. Thomas, Ch.
format	Article
author	Balk, L.J. Heiderhoff, R. Phang, J.C.H. Thomas, Ch.
spellingShingle	Balk, L.J. Heiderhoff, R. Phang, J.C.H. Thomas, Ch. Characterization of electronic materials and devices by scanning near-field microscopy
author_sort	Balk, L.J.
title	Characterization of electronic materials and devices by scanning near-field microscopy
title_short	Characterization of electronic materials and devices by scanning near-field microscopy
title_full	Characterization of electronic materials and devices by scanning near-field microscopy
title_fullStr	Characterization of electronic materials and devices by scanning near-field microscopy
title_full_unstemmed	Characterization of electronic materials and devices by scanning near-field microscopy
title_sort	characterization of electronic materials and devices by scanning near-field microscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/55273
_version_	1781412101293604864

Characterization of electronic materials and devices by scanning near-field microscopy

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