Characterization of interconnect defects using scanning thermal conductivity microscopy

by Ho, H.W., Phang, J.C.H., Altes, A., Balk, L.J.
Published 2014

Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy

by Hendarto, E., Altes, A., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)

by Lee, T.H., Fiege, G.B.M., Altes, A., Zimmermann, G., Ng, V., Heiderhoff, R., Phang, J.C.H., Balk, L.J.
Published 2014

Investigation of tunnel-regenerated multi-active-region light-emitting diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)

by Lee, T.H., Guo, X., Shen, G.D., Ji, Y., Wang, G.H., Du, J.Y., Wang, X.Z., Gao, G., Altes, A., Balk, Lj., Phang, J.C.H.
Published 2014