Investigation of tunnel-regenerated multi-active-region light-emitting diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)

• Main Authors: Lee, T.H., Guo, X., Shen, G.D., Ji, Y., Wang, G.H., Du, J.Y., Wang, X.Z., Gao, G., Altes, A., Balk, Lj., Phang, J.C.H.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/70690
• Institution: National University of Singapore

Microelectronics Reliability