Investigation of tunnel-regenerated multi-active-region light-emitting diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)
Microelectronics Reliability
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Main Authors: | Lee, T.H., Guo, X., Shen, G.D., Ji, Y., Wang, G.H., Du, J.Y., Wang, X.Z., Gao, G., Altes, A., Balk, Lj., Phang, J.C.H. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/70690 |
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Institution: | National University of Singapore |
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