Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

Annual Proceedings - Reliability Physics (Symposium)

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Bibliographic Details
Main Authors: Wittpahl, V., Liu, Y.Y., Chan, D.S.H., Chim, W.K., Phang, J.C.H., Balk, L.J., Yan, K.P.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72556
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/72556

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