Study on LED degradation using CL, EBIC and a two-diode parameter extraction model

Study on LED degradation using CL, EBIC and a two-diode parameter extraction model

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Saved in:
Bibliographic Details
Main Authors: Xiao, H., Liu, Y.Y., Phang, J.C.H., Chan, D.S.H., Chim, W.K., Yan, K.P.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72952
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/72952

Similar Items