A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

10.1016/0038-1101(94)90096-5

Saved in:
Bibliographic Details
Main Authors: Ong, V.K.S., Phang, J.C.H., Chan, D.S.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54071
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore