A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

by Ong, V.K.S., Phang, J.C.H., Chan, D.S.H.
Published 2014

Unconnected junction contrast in ion beam induced charge microscopy

by Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F.
Published 2014

Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysis

by Osipowicz, T., Sanchez, J.L., FWatt, Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H.
Published 2014

New developments in beam induced current methods for the failure analysis of VLSI circuits

by Chan, D.S.H., Phang, J.C.H., Lau, W.S., Ong, V.K.S., Sane, V., Kolachina, S., Osipowicz, T., Watt, F.
Published 2014

Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

by Osipowicz, T., Sanchez, J.L., Orlić, I., Watt, F., Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H.
Published 2014

Single contact beam induced current phenomenon for microelectronic failure analysis

by Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
Published 2014

Single contact beam induced current phenomenon for microelectronic failure analysis

by Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
Published 2014