Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

by Chin, J.M., Phang, J.C.H., Chan, D.S.H., Soh, C.E., Gilfeather, G.
Published 2014

Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

by Chin, J.M., Phang, J.C.H., Chan, D.S.H., Soh, C.E., Gilfeather, G.
Published 2014

DC-coupled laser induced detection system for fault localization in microelectronic failure analysis

by Quah, A.C.T., Koh, L.S., Chua, C.M., Palaniappan, M., Chin, J.M., Phang, J.C.H.
Published 2014

Application of Single Contact Optical Beam Induced Currents (SCOBIC) for Backside Failure Analysis

by Palaniappan, M., Chin, J.M., Phang, J.C.H., Chan, D.S.H., Soh, C.E., Gilfeather, G.
Published 2014

Single contact optical beam induced currents

by Chin, J.M., Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Gilfeather, G., Soh, C.E.
Published 2014

Thermally stable glassy luminescent cyclotriphosphazenes

by Ng, J.K.-P., Cho, C.M., Chin, J.M., Ke, K.L., He, C., Xu, J.
Published 2014

Thermally stable glassy luminescent cyclotriphosphazenes

by Ng, J.K.-P., Cho, C.M., Chin, J.M., Ke, K.L., He, C., Xu, J.
Published 2014

Solution-processable multicolored dithienothiophene-based conjugated polymers for electrochromic applications

by Neo, W.T., Cho, C.M., Song, J., Chin, J.M., Wang, X., He, C., Chan, H.S.O., Xu, J.
Published 2014

Single contact beam induced current phenomenon for microelectronic failure analysis

by Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
Published 2014

Single contact beam induced current phenomenon for microelectronic failure analysis

by Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
Published 2014

Combining refractive solid immersion lens and pulsed laser-induced technique for integrated circuit failure analysis

by Goh, S.H., Quah, A.C.T., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H.
Published 2014

Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors

by Quah, A.C.T., Goh, S.H., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H.
Published 2014

New signal detection methods for thermal beam induced phenomenon

by Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H., Phang, J.C.H., Gilfeather, G.
Published 2014

A review of laser induced techniques for microelectronic failure analysis

by Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Gilfeather, G., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H.
Published 2014