Single contact beam induced current phenomenon for microelectronic failure analysis

• Main Authors: Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/81750
• Institution: National University of Singapore

Microelectronics Reliability