SINGLE CONTACT PHENOMENA IN BEAM INDUCED CURRENT MICROSCOPY

بواسطة KOLACHINA SIVARAMAKRISHNA
منشور في 2020

Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model

بواسطة Kolachina, S., Phang, J.C.H., Chan, D.S.H.
منشور في 2014

Pulsed single contact optical beam induced current analysis of integrated circuits

بواسطة MIN, CHIN JIANN, KOLACHINA, SIVARAMAKRISHNA, PHANG, JACOB C. H., CHAN, DANIEL S. H.
منشور في 2012

Ion Beam Induced Charge imaging for the failure analysis of semiconductor devices

بواسطة Kolachina, S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Sanchez, J.L., Watt, F.
منشور في 2014

Unconnected junction contrast in ion beam induced charge microscopy

بواسطة Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F.
منشور في 2014

Fluence dependence of IBIC collection efficiency of CMOS transistors

بواسطة Osipowicz, T., Sanchez, J.L., Orlic, I., Watt, F., Kolachina, S., Chan, D.S.H., Phang, J.C.H.
منشور في 2014

Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysis

بواسطة Osipowicz, T., Sanchez, J.L., FWatt, Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H.
منشور في 2014

New developments in beam induced current methods for the failure analysis of VLSI circuits

بواسطة Chan, D.S.H., Phang, J.C.H., Lau, W.S., Ong, V.K.S., Sane, V., Kolachina, S., Osipowicz, T., Watt, F.
منشور في 2014

Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

بواسطة Osipowicz, T., Sanchez, J.L., Orlić, I., Watt, F., Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H.
منشور في 2014

Single contact beam induced current phenomenon for microelectronic failure analysis

بواسطة Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
منشور في 2014