Unconnected junction contrast in ion beam induced charge microscopy

Unconnected junction contrast in ion beam induced charge microscopy

10.1063/1.116390

Saved in:
Bibliographic Details
Main Authors: Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62909
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/62909

Similar Items