Unconnected junction contrast in ion beam induced charge microscopy
10.1063/1.116390
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2014
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sg-nus-scholar.10635-629092023-10-30T10:18:19Z Unconnected junction contrast in ion beam induced charge microscopy Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H. Osipowicz, T. Watt, F. ELECTRICAL ENGINEERING PHYSICS 10.1063/1.116390 Applied Physics Letters 68 4 532-534 APPLA 2014-06-17T06:56:12Z 2014-06-17T06:56:12Z 1996 Article Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F. (1996). Unconnected junction contrast in ion beam induced charge microscopy. Applied Physics Letters 68 (4) : 532-534. ScholarBank@NUS Repository. https://doi.org/10.1063/1.116390 00036951 http://scholarbank.nus.edu.sg/handle/10635/62909 A1996TQ55000034 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
10.1063/1.116390 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H. Osipowicz, T. Watt, F. |
| format |
Article |
| author |
Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H. Osipowicz, T. Watt, F. |
| spellingShingle |
Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H. Osipowicz, T. Watt, F. Unconnected junction contrast in ion beam induced charge microscopy |
| author_sort |
Kolachina, S. |
| title |
Unconnected junction contrast in ion beam induced charge microscopy |
| title_short |
Unconnected junction contrast in ion beam induced charge microscopy |
| title_full |
Unconnected junction contrast in ion beam induced charge microscopy |
| title_fullStr |
Unconnected junction contrast in ion beam induced charge microscopy |
| title_full_unstemmed |
Unconnected junction contrast in ion beam induced charge microscopy |
| title_sort |
unconnected junction contrast in ion beam induced charge microscopy |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62909 |
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1781782167419879424 |