Unconnected junction contrast in ion beam induced charge microscopy

10.1063/1.116390

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Bibliographic Details
Main Authors: Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62909
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-629092023-10-30T10:18:19Z Unconnected junction contrast in ion beam induced charge microscopy Kolachina, S. Ong, V.K.S. Chan, D.S.H. Phang, J.C.H. Osipowicz, T. Watt, F. ELECTRICAL ENGINEERING PHYSICS 10.1063/1.116390 Applied Physics Letters 68 4 532-534 APPLA 2014-06-17T06:56:12Z 2014-06-17T06:56:12Z 1996 Article Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F. (1996). Unconnected junction contrast in ion beam induced charge microscopy. Applied Physics Letters 68 (4) : 532-534. ScholarBank@NUS Repository. https://doi.org/10.1063/1.116390 00036951 http://scholarbank.nus.edu.sg/handle/10635/62909 A1996TQ55000034 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.116390
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Kolachina, S.
Ong, V.K.S.
Chan, D.S.H.
Phang, J.C.H.
Osipowicz, T.
Watt, F.
format Article
author Kolachina, S.
Ong, V.K.S.
Chan, D.S.H.
Phang, J.C.H.
Osipowicz, T.
Watt, F.
spellingShingle Kolachina, S.
Ong, V.K.S.
Chan, D.S.H.
Phang, J.C.H.
Osipowicz, T.
Watt, F.
Unconnected junction contrast in ion beam induced charge microscopy
author_sort Kolachina, S.
title Unconnected junction contrast in ion beam induced charge microscopy
title_short Unconnected junction contrast in ion beam induced charge microscopy
title_full Unconnected junction contrast in ion beam induced charge microscopy
title_fullStr Unconnected junction contrast in ion beam induced charge microscopy
title_full_unstemmed Unconnected junction contrast in ion beam induced charge microscopy
title_sort unconnected junction contrast in ion beam induced charge microscopy
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/62909
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