Ion beam induced charge microscopy studies of power diodes

Ion beam induced charge microscopy studies of power diodes

10.1088/0953-8984/16/2/007

Saved in:
Bibliographic Details
Main Authors: Zmeck, M., Balk, L.J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/51197
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/51197

Similar Items