Ion beam induced charge microscopy studies of power diodes
10.1088/0953-8984/16/2/007
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sg-nus-scholar.10635-511972023-10-26T08:27:06Z Ion beam induced charge microscopy studies of power diodes Zmeck, M. Balk, L.J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J. PHYSICS ELECTRICAL & COMPUTER ENGINEERING 10.1088/0953-8984/16/2/007 Journal of Physics Condensed Matter 16 2 S57-S66 JCOME 2014-04-24T08:36:07Z 2014-04-24T08:36:07Z 2004-01-21 Conference Paper Zmeck, M., Balk, L.J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J. (2004-01-21). Ion beam induced charge microscopy studies of power diodes. Journal of Physics Condensed Matter 16 (2) : S57-S66. ScholarBank@NUS Repository. https://doi.org/10.1088/0953-8984/16/2/007 09538984 http://scholarbank.nus.edu.sg/handle/10635/51197 000189006900008 Scopus |
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10.1088/0953-8984/16/2/007 |
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PHYSICS Zmeck, M. Balk, L.J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J. |
format |
Conference or Workshop Item |
author |
Zmeck, M. Balk, L.J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J. |
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Zmeck, M. Balk, L.J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J. Ion beam induced charge microscopy studies of power diodes |
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Zmeck, M. |
title |
Ion beam induced charge microscopy studies of power diodes |
title_short |
Ion beam induced charge microscopy studies of power diodes |
title_full |
Ion beam induced charge microscopy studies of power diodes |
title_fullStr |
Ion beam induced charge microscopy studies of power diodes |
title_full_unstemmed |
Ion beam induced charge microscopy studies of power diodes |
title_sort |
ion beam induced charge microscopy studies of power diodes |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/51197 |
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