Ion beam induced charge microscopy studies of power diodes

10.1088/0953-8984/16/2/007

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Main Authors: Zmeck, M., Balk, L.J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/51197
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-511972023-10-26T08:27:06Z Ion beam induced charge microscopy studies of power diodes Zmeck, M. Balk, L.J. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J. PHYSICS ELECTRICAL & COMPUTER ENGINEERING 10.1088/0953-8984/16/2/007 Journal of Physics Condensed Matter 16 2 S57-S66 JCOME 2014-04-24T08:36:07Z 2014-04-24T08:36:07Z 2004-01-21 Conference Paper Zmeck, M., Balk, L.J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J. (2004-01-21). Ion beam induced charge microscopy studies of power diodes. Journal of Physics Condensed Matter 16 (2) : S57-S66. ScholarBank@NUS Repository. https://doi.org/10.1088/0953-8984/16/2/007 09538984 http://scholarbank.nus.edu.sg/handle/10635/51197 000189006900008 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1088/0953-8984/16/2/007
author2 PHYSICS
author_facet PHYSICS
Zmeck, M.
Balk, L.J.
Osipowicz, T.
Watt, F.
Phang, J.C.H.
Khambadkone, A.M.
Niedernostheide, F.-J.
Schulze, H.-J.
format Conference or Workshop Item
author Zmeck, M.
Balk, L.J.
Osipowicz, T.
Watt, F.
Phang, J.C.H.
Khambadkone, A.M.
Niedernostheide, F.-J.
Schulze, H.-J.
spellingShingle Zmeck, M.
Balk, L.J.
Osipowicz, T.
Watt, F.
Phang, J.C.H.
Khambadkone, A.M.
Niedernostheide, F.-J.
Schulze, H.-J.
Ion beam induced charge microscopy studies of power diodes
author_sort Zmeck, M.
title Ion beam induced charge microscopy studies of power diodes
title_short Ion beam induced charge microscopy studies of power diodes
title_full Ion beam induced charge microscopy studies of power diodes
title_fullStr Ion beam induced charge microscopy studies of power diodes
title_full_unstemmed Ion beam induced charge microscopy studies of power diodes
title_sort ion beam induced charge microscopy studies of power diodes
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/51197
_version_ 1781411662297825280