Ion beam induced charge microscopy studies of power diodes
10.1088/0953-8984/16/2/007
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Main Authors: | Zmeck, M., Balk, L.J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J. |
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Other Authors: | PHYSICS |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/51197 |
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Institution: | National University of Singapore |
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