Ion beam induced charge microscopy studies of power diodes

Ion beam induced charge microscopy studies of power diodes

10.1088/0953-8984/16/2/007

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Bibliographic Details
Main Authors:	Zmeck, M., Balk, L.J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J.
Other Authors:	PHYSICS
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/51197
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Institution:	National University of Singapore

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