Unconnected junction contrast in ion beam induced charge microscopy

10.1063/1.116390

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Bibliographic Details
Main Authors: Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62909
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Institution: National University of Singapore
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