Unconnected junction contrast in ion beam induced charge microscopy

10.1063/1.116390

Saved in:

Bibliographic Details
Main Authors:	Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Watt, F.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62909
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

Be the first to leave a comment!

Similar Items