Single contact beam induced current phenomenon for microelectronic failure analysis

Microelectronics Reliability

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Bibliographic Details
Main Authors:	Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81750
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Institution:	National University of Singapore

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record_format	dspace
spelling	sg-nus-scholar.10635-817502021-10-01T10:31:01Z Single contact beam induced current phenomenon for microelectronic failure analysis Phang, J.C.H. Chan, D.S.H. Ong, V.K.S. Kolachina, S. Chin, J.M. Palaniappan, M. Gilfeather, G. Seah, Y.X. ELECTRICAL & COMPUTER ENGINEERING ELECTRICAL ENGINEERING Microelectronics Reliability 43 9-11 1595-1602 MCRLA 2014-10-07T03:11:37Z 2014-10-07T03:11:37Z 2003-09 Phang, J.C.H., Chan, D.S.H., Ong, V.K.S., Kolachina, S., Chin, J.M., Palaniappan, M., Gilfeather, G., Seah, Y.X. (2003-09). Single contact beam induced current phenomenon for microelectronic failure analysis. Microelectronics Reliability 43 (9-11) : 1595-1602. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/81750 000185791500041 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Microelectronics Reliability
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Phang, J.C.H. Chan, D.S.H. Ong, V.K.S. Kolachina, S. Chin, J.M. Palaniappan, M. Gilfeather, G. Seah, Y.X.
author	Phang, J.C.H. Chan, D.S.H. Ong, V.K.S. Kolachina, S. Chin, J.M. Palaniappan, M. Gilfeather, G. Seah, Y.X.
spellingShingle	Phang, J.C.H. Chan, D.S.H. Ong, V.K.S. Kolachina, S. Chin, J.M. Palaniappan, M. Gilfeather, G. Seah, Y.X. Single contact beam induced current phenomenon for microelectronic failure analysis
author_sort	Phang, J.C.H.
title	Single contact beam induced current phenomenon for microelectronic failure analysis
title_short	Single contact beam induced current phenomenon for microelectronic failure analysis
title_full	Single contact beam induced current phenomenon for microelectronic failure analysis
title_fullStr	Single contact beam induced current phenomenon for microelectronic failure analysis
title_full_unstemmed	Single contact beam induced current phenomenon for microelectronic failure analysis
title_sort	single contact beam induced current phenomenon for microelectronic failure analysis
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81750
_version_	1713206995208634368

Single contact beam induced current phenomenon for microelectronic failure analysis

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