DC-coupled laser induced detection system for fault localization in microelectronic failure analysis

DC-coupled laser induced detection system for fault localization in microelectronic failure analysis

10.1109/IPFA.2006.250981

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Bibliographic Details
Main Authors: Quah, A.C.T., Koh, L.S., Chua, C.M., Palaniappan, M., Chin, J.M., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69780
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/69780

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