DC-coupled laser induced detection system for fault localization in microelectronic failure analysis
10.1109/IPFA.2006.250981
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sg-nus-scholar.10635-697802015-01-14T12:20:40Z DC-coupled laser induced detection system for fault localization in microelectronic failure analysis Quah, A.C.T. Koh, L.S. Chua, C.M. Palaniappan, M. Chin, J.M. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IPFA.2006.250981 Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 327-332 2014-06-19T03:04:34Z 2014-06-19T03:04:34Z 2006 Conference Paper Quah, A.C.T.,Koh, L.S.,Chua, C.M.,Palaniappan, M.,Chin, J.M.,Phang, J.C.H. (2006). DC-coupled laser induced detection system for fault localization in microelectronic failure analysis. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 327-332. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2006.250981" target="_blank">https://doi.org/10.1109/IPFA.2006.250981</a> 1424402069 http://scholarbank.nus.edu.sg/handle/10635/69780 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
10.1109/IPFA.2006.250981 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Quah, A.C.T. Koh, L.S. Chua, C.M. Palaniappan, M. Chin, J.M. Phang, J.C.H. |
| format |
Conference or Workshop Item |
| author |
Quah, A.C.T. Koh, L.S. Chua, C.M. Palaniappan, M. Chin, J.M. Phang, J.C.H. |
| spellingShingle |
Quah, A.C.T. Koh, L.S. Chua, C.M. Palaniappan, M. Chin, J.M. Phang, J.C.H. DC-coupled laser induced detection system for fault localization in microelectronic failure analysis |
| author_sort |
Quah, A.C.T. |
| title |
DC-coupled laser induced detection system for fault localization in microelectronic failure analysis |
| title_short |
DC-coupled laser induced detection system for fault localization in microelectronic failure analysis |
| title_full |
DC-coupled laser induced detection system for fault localization in microelectronic failure analysis |
| title_fullStr |
DC-coupled laser induced detection system for fault localization in microelectronic failure analysis |
| title_full_unstemmed |
DC-coupled laser induced detection system for fault localization in microelectronic failure analysis |
| title_sort |
dc-coupled laser induced detection system for fault localization in microelectronic failure analysis |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/69780 |
| _version_ |
1681087076442832896 |