DC-coupled laser induced detection system for fault localization in microelectronic failure analysis
10.1109/IPFA.2006.250981
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Main Authors: | Quah, A.C.T., Koh, L.S., Chua, C.M., Palaniappan, M., Chin, J.M., Phang, J.C.H. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69780 |
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Institution: | National University of Singapore |
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