Correlation of flash memory defects detected with passive and active localization techniques

Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004

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Bibliographic Details
Main Authors: Quah, A.C.T., Phang, J.C.H., Li, S., Massoodi, M., Yuan, C., Koh, L.S., Chan, K.H., Chua, C.M.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69753
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Institution: National University of Singapore