Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors

Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors

10.1361/cp2008istfa402

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Bibliographic Details
Main Authors: Quah, A.C.T., Goh, S.H., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69636
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/69636

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