Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors

• Main Authors: Quah, A.C.T., Goh, S.H., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/69636
• Institution: National University of Singapore

10.1361/cp2008istfa402