$Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors$

Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors

10.1361/cp2008istfa402

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Bibliographic Details
Main Authors:	Quah, A.C.T., Goh, S.H., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69636
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69636
record_format	dspace
spelling	sg-nus-scholar.10635-696362023-10-27T08:36:27Z Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors Quah, A.C.T. Goh, S.H. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING 10.1361/cp2008istfa402 Conference Proceedings from the International Symposium for Testing and Failure Analysis 402-406 2014-06-19T03:02:57Z 2014-06-19T03:02:57Z 2008 Conference Paper Quah, A.C.T., Goh, S.H., Ravikumar, V.K., Phoa, S.L., Narang, V., Chin, J.M., Chua, C.M., Phang, J.C.H. (2008). Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 402-406. ScholarBank@NUS Repository. https://doi.org/10.1361/cp2008istfa402 9780871707147 http://scholarbank.nus.edu.sg/handle/10635/69636 000288182500074 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1361/cp2008istfa402
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Quah, A.C.T. Goh, S.H. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H.
format	Conference or Workshop Item
author	Quah, A.C.T. Goh, S.H. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H.
spellingShingle	Quah, A.C.T. Goh, S.H. Ravikumar, V.K. Phoa, S.L. Narang, V. Chin, J.M. Chua, C.M. Phang, J.C.H. Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors
author_sort	Quah, A.C.T.
title	Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors
title_short	Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors
title_full	Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors
title_fullStr	Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors
title_full_unstemmed	Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors
title_sort	combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69636
_version_	1781783108259938304

Combining refractive solid immersion lens and pulsed laser induced techniques for effective defect localization on microprocessors

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