Correlation of flash memory defects detected with passive and active localization techniques

Correlation of flash memory defects detected with passive and active localization techniques

Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004

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Main Authors: Quah, A.C.T., Phang, J.C.H., Li, S., Massoodi, M., Yuan, C., Koh, L.S., Chan, K.H., Chua, C.M.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69753
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-697532015-01-14T05:51:25Z Correlation of flash memory defects detected with passive and active localization techniques Quah, A.C.T. Phang, J.C.H. Li, S. Massoodi, M. Yuan, C. Koh, L.S. Chan, K.H. Chua, C.M. ELECTRICAL & COMPUTER ENGINEERING Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004 604-608 2014-06-19T03:04:17Z 2014-06-19T03:04:17Z 2004 Conference Paper Quah, A.C.T.,Phang, J.C.H.,Li, S.,Massoodi, M.,Yuan, C.,Koh, L.S.,Chan, K.H.,Chua, C.M. (2004). Correlation of flash memory defects detected with passive and active localization techniques. Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004 : 604-608. ScholarBank@NUS Repository. 0871708078 http://scholarbank.nus.edu.sg/handle/10635/69753 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Quah, A.C.T.
Phang, J.C.H.
Li, S.
Massoodi, M.
Yuan, C.
Koh, L.S.
Chan, K.H.
Chua, C.M.
format Conference or Workshop Item
author Quah, A.C.T.
Phang, J.C.H.
Li, S.
Massoodi, M.
Yuan, C.
Koh, L.S.
Chan, K.H.
Chua, C.M.
spellingShingle Quah, A.C.T.
Phang, J.C.H.
Li, S.
Massoodi, M.
Yuan, C.
Koh, L.S.
Chan, K.H.
Chua, C.M.
Correlation of flash memory defects detected with passive and active localization techniques
author_sort Quah, A.C.T.
title Correlation of flash memory defects detected with passive and active localization techniques
title_short Correlation of flash memory defects detected with passive and active localization techniques
title_full Correlation of flash memory defects detected with passive and active localization techniques
title_fullStr Correlation of flash memory defects detected with passive and active localization techniques
title_full_unstemmed Correlation of flash memory defects detected with passive and active localization techniques
title_sort correlation of flash memory defects detected with passive and active localization techniques
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/69753
_version_ 1681087071427493888

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