N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques

10.1063/1.3633108

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書目詳細資料
Main Authors: Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/56770
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