N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques
10.1063/1.3633108
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sg-nus-scholar.10635-567702023-10-26T07:18:15Z N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.3633108 Applied Physics Letters 99 9 - APPLA 2014-06-17T02:58:25Z 2014-06-17T02:58:25Z 2011-08-29 Article Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H. (2011-08-29). N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques. Applied Physics Letters 99 (9) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3633108 00036951 http://scholarbank.nus.edu.sg/handle/10635/56770 000294489300089 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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| description |
10.1063/1.3633108 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H. |
| format |
Article |
| author |
Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H. |
| spellingShingle |
Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H. N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques |
| author_sort |
Teo, J.K.J. |
| title |
N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques |
| title_short |
N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques |
| title_full |
N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques |
| title_fullStr |
N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques |
| title_full_unstemmed |
N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques |
| title_sort |
n-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/56770 |
| _version_ |
1781781276204728320 |