Backside reflectance modulation of microscale metal interconnects

by Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
Published 2014

N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques

by Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
Published 2014

Characterization of MOS transistors using dynamic backside reflectance modulation technique

by Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
Published 2014

Negative backside thermoreflectance modulation of microscale metal interconnects

by Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
Published 2014

Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETs

by Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.
Published 2014