Characterization of MOS transistors using dynamic backside reflectance modulation technique

Characterization of MOS transistors using dynamic backside reflectance modulation technique

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors: Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69589
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/69589

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