Characterization of MOS transistors using dynamic backside reflectance modulation technique

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors:	Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69589
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69589
record_format	dspace
spelling	sg-nus-scholar.10635-695892015-01-11T05:40:51Z Characterization of MOS transistors using dynamic backside reflectance modulation technique Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 170-175 2014-06-19T03:02:23Z 2014-06-19T03:02:23Z 2011 Conference Paper Teo, J.K.J.,Chua, C.M.,Koh, L.S.,Phang, J.C.H. (2011). Characterization of MOS transistors using dynamic backside reflectance modulation technique. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 170-175. ScholarBank@NUS Repository. 9781615038268 http://scholarbank.nus.edu.sg/handle/10635/69589 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Conference Proceedings from the International Symposium for Testing and Failure Analysis
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H.
format	Conference or Workshop Item
author	Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H.
spellingShingle	Teo, J.K.J. Chua, C.M. Koh, L.S. Phang, J.C.H. Characterization of MOS transistors using dynamic backside reflectance modulation technique
author_sort	Teo, J.K.J.
title	Characterization of MOS transistors using dynamic backside reflectance modulation technique
title_short	Characterization of MOS transistors using dynamic backside reflectance modulation technique
title_full	Characterization of MOS transistors using dynamic backside reflectance modulation technique
title_fullStr	Characterization of MOS transistors using dynamic backside reflectance modulation technique
title_full_unstemmed	Characterization of MOS transistors using dynamic backside reflectance modulation technique
title_sort	characterization of mos transistors using dynamic backside reflectance modulation technique
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69589
_version_	1681087041451851776

Characterization of MOS transistors using dynamic backside reflectance modulation technique

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