New signal detection methods for thermal beam induced phenomenon

by Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H., Phang, J.C.H., Gilfeather, G.
Published 2014

A review of laser induced techniques for microelectronic failure analysis

by Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Gilfeather, G., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H.
Published 2014