A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan
10.1016/0038-1101(94)90096-5
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Main Authors: | Ong, V.K.S., Phang, J.C.H., Chan, D.S.H. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/54071 |
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Institution: | National University of Singapore |
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