A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan

10.1016/0038-1101(94)90096-5

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Bibliographic Details
Main Authors: Ong, V.K.S., Phang, J.C.H., Chan, D.S.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54071
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Institution: National University of Singapore
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Summary:10.1016/0038-1101(94)90096-5

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