An energy dependent model for type I magnetic contrast in the scanning electron microscope

An energy dependent model for type I magnetic contrast in the scanning electron microscope

Scanning Microscopy

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Bibliographic Details
Main Authors: Chim, W.K., Chan, D.S.H., Phang, J.C.H., Low, T.S., Thirumalai, S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
energy filtering
field-distance integral
Magnetic contrast
quality factor
scanning electron microscope
secondary electrons
type I magnetic contrast
work function
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61805
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/61805

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