An energy dependent model for type I magnetic contrast in the scanning electron microscope

• Main Authors: Chim, W.K., Chan, D.S.H., Phang, J.C.H., Low, T.S., Thirumalai, S.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Article
• Published: 2014
• Subjects: energy filtering; field-distance integral; Magnetic contrast; quality factor; scanning electron microscope; secondary electrons; type I magnetic contrast; work function
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/61805
• Institution: National University of Singapore

Scanning Microscopy