Cathodoluminescence contrast of localized defects part I. Numerical model for simulation

Cathodoluminescence contrast of localized defects part I. Numerical model for simulation

Scanning Microscopy

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Bibliographic Details
Main Authors: Pey, K.L., Chan, D.S.H., Phang, J.C.H., Breese, J.F., Myhajlenko, S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Cathodoluminescence
cathodoluminescence contrast
defects
Monte Carlo
numerical model
scanning electron microscope
semiconductors
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61920
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/61920

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