Cathodoluminescence contrast of localized defects part I. Numerical model for simulation

Cathodoluminescence contrast of localized defects part I. Numerical model for simulation

Scanning Microscopy

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Main Authors: Pey, K.L., Chan, D.S.H., Phang, J.C.H., Breese, J.F., Myhajlenko, S.
Other Authors: INSTITUTE OF MICROELECTRONICS
Format: Article
Published: 2014
Subjects:
Cathodoluminescence
cathodoluminescence contrast
defects
Monte Carlo
numerical model
scanning electron microscope
semiconductors
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61920
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-619202024-11-13T12:53:59Z Cathodoluminescence contrast of localized defects part I. Numerical model for simulation Pey, K.L. Chan, D.S.H. Phang, J.C.H. Breese, J.F. Myhajlenko, S. INSTITUTE OF MICROELECTRONICS ELECTRICAL ENGINEERING Cathodoluminescence cathodoluminescence contrast defects Monte Carlo numerical model scanning electron microscope semiconductors Scanning Microscopy 9 2 355-366 SCMIE 2014-06-17T06:45:28Z 2014-06-17T06:45:28Z 1995 Article Pey, K.L.,Chan, D.S.H.,Phang, J.C.H.,Breese, J.F.,Myhajlenko, S. (1995). Cathodoluminescence contrast of localized defects part I. Numerical model for simulation. Scanning Microscopy 9 (2) : 355-366. ScholarBank@NUS Repository. 08917035 http://scholarbank.nus.edu.sg/handle/10635/61920 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Cathodoluminescence
cathodoluminescence contrast
defects
Monte Carlo
numerical model
scanning electron microscope
semiconductors
spellingShingle Cathodoluminescence
cathodoluminescence contrast
defects
Monte Carlo
numerical model
scanning electron microscope
semiconductors
Pey, K.L.
Chan, D.S.H.
Phang, J.C.H.
Breese, J.F.
Myhajlenko, S.
Cathodoluminescence contrast of localized defects part I. Numerical model for simulation
description Scanning Microscopy
author2 INSTITUTE OF MICROELECTRONICS
author_facet INSTITUTE OF MICROELECTRONICS
Pey, K.L.
Chan, D.S.H.
Phang, J.C.H.
Breese, J.F.
Myhajlenko, S.
format Article
author Pey, K.L.
Chan, D.S.H.
Phang, J.C.H.
Breese, J.F.
Myhajlenko, S.
author_sort Pey, K.L.
title Cathodoluminescence contrast of localized defects part I. Numerical model for simulation
title_short Cathodoluminescence contrast of localized defects part I. Numerical model for simulation
title_full Cathodoluminescence contrast of localized defects part I. Numerical model for simulation
title_fullStr Cathodoluminescence contrast of localized defects part I. Numerical model for simulation
title_full_unstemmed Cathodoluminescence contrast of localized defects part I. Numerical model for simulation
title_sort cathodoluminescence contrast of localized defects part i. numerical model for simulation
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/61920
_version_ 1821204583386447872

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