Junction depth & defect characterization with the use of EBIC

There are two objectives to be achieved in this work. Firstly, it is desirable to determine a new method of reconstructing the charge collection probability so as to extract the junction depth of the device. Secondly, it is also desirable to extract the defect location using the perpendicular p-n ju...

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Bibliographic Details
Main Author: Phua, Poh Chin.
Other Authors: Ong, Vincent Keng Sian
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3135
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Institution: Nanyang Technological University