Dedicated near-field microscopies for electronic materials and devices

10.1117/12.621577

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Bibliographic Details
Main Authors:	Balk, L.J., Cramer, R.M., Heiderhoff, R., Phang, J.Ch., Sergeev, O., Tiedemann, A.-K.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Atomic force microscopy Electronic devices Functional materials Near-field scanning microscopy Scanning photon emission microscopy Thermo-mechanical properties
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69799
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-697992023-10-27T07:05:13Z Dedicated near-field microscopies for electronic materials and devices Balk, L.J. Cramer, R.M. Heiderhoff, R. Phang, J.Ch. Sergeev, O. Tiedemann, A.-K. ELECTRICAL & COMPUTER ENGINEERING Atomic force microscopy Electronic devices Functional materials Near-field scanning microscopy Scanning photon emission microscopy Thermo-mechanical properties 10.1117/12.621577 Proceedings of SPIE - The International Society for Optical Engineering 5856 PART I 1-13 PSISD 2014-06-19T03:04:47Z 2014-06-19T03:04:47Z 2005 Conference Paper Balk, L.J., Cramer, R.M., Heiderhoff, R., Phang, J.Ch., Sergeev, O., Tiedemann, A.-K. (2005). Dedicated near-field microscopies for electronic materials and devices. Proceedings of SPIE - The International Society for Optical Engineering 5856 PART I : 1-13. ScholarBank@NUS Repository. https://doi.org/10.1117/12.621577 0277786X http://scholarbank.nus.edu.sg/handle/10635/69799 000231416400001 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Atomic force microscopy Electronic devices Functional materials Near-field scanning microscopy Scanning photon emission microscopy Thermo-mechanical properties
spellingShingle	Atomic force microscopy Electronic devices Functional materials Near-field scanning microscopy Scanning photon emission microscopy Thermo-mechanical properties Balk, L.J. Cramer, R.M. Heiderhoff, R. Phang, J.Ch. Sergeev, O. Tiedemann, A.-K. Dedicated near-field microscopies for electronic materials and devices
description	10.1117/12.621577
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Balk, L.J. Cramer, R.M. Heiderhoff, R. Phang, J.Ch. Sergeev, O. Tiedemann, A.-K.
format	Conference or Workshop Item
author	Balk, L.J. Cramer, R.M. Heiderhoff, R. Phang, J.Ch. Sergeev, O. Tiedemann, A.-K.
author_sort	Balk, L.J.
title	Dedicated near-field microscopies for electronic materials and devices
title_short	Dedicated near-field microscopies for electronic materials and devices
title_full	Dedicated near-field microscopies for electronic materials and devices
title_fullStr	Dedicated near-field microscopies for electronic materials and devices
title_full_unstemmed	Dedicated near-field microscopies for electronic materials and devices
title_sort	dedicated near-field microscopies for electronic materials and devices
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69799
_version_	1781783117546127360

Dedicated near-field microscopies for electronic materials and devices

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