A new PUF based lock and key solution for secure in-field testing of cryptographic chips

• Main Authors: Cui, Aijiao, Chang, Chip-Hong, Zhou, Wei, Zheng, Yue
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2021
• 主題: Engineering::Electrical and electronic engineering; Scan Chain; Scan-based Side-channel Attack; Lock and Key; Golden Key; Physical Unclonable Function
• 在線閱讀: https://hdl.handle.net/10356/151585
• 機構: Nanyang Technological University

Scan-based side-channel attacks have become a new threat to cryptographic chips. Existing countermeasures require a secret test key to unlock the scan chain before in-field testing is allowed. However, test key disclosure poses tremendous risks to multiple crypto chips that share a common test key....