Ho, H., Zheng, X., Phang, J., Balk, L., & ENGINEERING, E. &. C. (2014). Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification.
Chicago Style CitationHo, H.W., X.H Zheng, J.C.H Phang, L.J Balk, and ELECTRICAL & COMPUTER ENGINEERING. Reliable and Accurate Temperature Measurement Using Scanning Thermal Microscopy With Double Lock-in Amplification. 2014.
MLA CitationHo, H.W., et al. Reliable and Accurate Temperature Measurement Using Scanning Thermal Microscopy With Double Lock-in Amplification. 2014.
Warning: These citations may not always be 100% accurate.