Scanning near-field photon emission microscopy
10.1109/RELPHY.2008.4558947
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2014
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sg-nus-scholar.10635-717062024-11-13T12:53:56Z Scanning near-field photon emission microscopy Isakov, D. Geinzer, T. Tio, A. Phang, J.C.H. Zhang, Y. Balk, L.J. ELECTRICAL & COMPUTER ENGINEERING 10.1109/RELPHY.2008.4558947 IEEE International Reliability Physics Symposium Proceedings 575-579 2014-06-19T03:26:50Z 2014-06-19T03:26:50Z 2008 Conference Paper Isakov, D., Geinzer, T., Tio, A., Phang, J.C.H., Zhang, Y., Balk, L.J. (2008). Scanning near-field photon emission microscopy. IEEE International Reliability Physics Symposium Proceedings : 575-579. ScholarBank@NUS Repository. https://doi.org/10.1109/RELPHY.2008.4558947 9781424420506 15417026 http://scholarbank.nus.edu.sg/handle/10635/71706 000257615900094 Scopus |
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10.1109/RELPHY.2008.4558947 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Isakov, D. Geinzer, T. Tio, A. Phang, J.C.H. Zhang, Y. Balk, L.J. |
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Conference or Workshop Item |
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Isakov, D. Geinzer, T. Tio, A. Phang, J.C.H. Zhang, Y. Balk, L.J. |
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Isakov, D. Geinzer, T. Tio, A. Phang, J.C.H. Zhang, Y. Balk, L.J. Scanning near-field photon emission microscopy |
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Isakov, D. |
title |
Scanning near-field photon emission microscopy |
title_short |
Scanning near-field photon emission microscopy |
title_full |
Scanning near-field photon emission microscopy |
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Scanning near-field photon emission microscopy |
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Scanning near-field photon emission microscopy |
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scanning near-field photon emission microscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/71706 |
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