Leong, S. H., Wang, J. P., Low, T. S., & ENGINEERING, E. (2014). Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films.
استشهاد بنمط شيكاغوLeong, Siang Huei, Jian Ping Wang, Teck Seng Low, و ELECTRICAL ENGINEERING. Study of In-depth Defects Using Magneto-optical Kerr Effect By Measuring the Magnetic Hardness Coefficient in Magnetic Thin Films. 2014.
MLA استشهادLeong, Siang Huei, Jian Ping Wang, Teck Seng Low, و ELECTRICAL ENGINEERING. Study of In-depth Defects Using Magneto-optical Kerr Effect By Measuring the Magnetic Hardness Coefficient in Magnetic Thin Films. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.